Detailansicht
Estimation of Lattice Strain by XRay Analysis
UDM, USDM and UDEDM
ISBN/EAN: 9783659950674
Umbreit-Nr.: 5716285
Sprache:
Englisch
Umfang: 84 S.
Format in cm: 0.6 x 22 x 15
Einband:
kartoniertes Buch
Erschienen am 05.10.2018
Auflage: 1/2018
- Zusatztext
- Wider Bandgap in IIVI semiconductor nanoparticles is important and advantageous for various potential applications including visible light photocatalysis. Due to the presence of polycrystalline aggregates the crystallite size of the particles is not generally the same as the particle size. Lattice strain is a measure of the distribution of lattice constants arising from crystal imperfections (lattice dislocation), triple junction, contact or sinter stresses, stacking faults, coherency stresses, etc. XRay Diffraction (XRD) analysis is powerful technique to estimate the crystallite size and lattice strain. In this present work, a comparative evaluation of the mean particle size of Ni doped CdS nanoparticles with different molar concentrations obtained from XRD broadening reported.
- Autorenportrait
- Nikita H. Patel competed her M.Phil and Ph.D. in field of nanoscience from Department of Physics, Sardar Patel University, Vallabh Vidyanagar, Gujarat, INDIA. Her area of research work involved synthesis and characterization of different transition metal doped semiconductor nanoparticles with antimicrobial activity.