Detailansicht
Functional Design Errors in Digital Circuits
eBook - Diagnosis Correction and Repair, Lecture Notes in Electrical Engineering
ISBN/EAN: 9781402093654
Umbreit-Nr.: 1601661
Sprache:
Englisch
Umfang: 200 S., 4.66 MB
Format in cm:
Einband:
Keine Angabe
Erschienen am 02.12.2008
Auflage: 1/2008
E-Book
Format: PDF
DRM: Digitales Wasserzeichen
- Zusatztext
- <P><EM>Functional Design Errors in Digital Circuits Diagnosis</EM> covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.</P>
- Kurztext
- <P>This text covers innovative methods to automate the debugging process throughout the design flow, enabling the production of more reliable electronic devices. It offers many examples and figures to illustrate key concepts and algorithms.</P>
- Autorenportrait
- <P>Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors</P><P></P>