Detailansicht
Noncontact Atomic Force Microscopy 2
NanoScience and Technology
ISBN/EAN: 9783642014949
Umbreit-Nr.: 1288307
Sprache:
Englisch
Umfang: xviii, 401 S., 28 s/w Illustr., 77 farbige Illustr
Format in cm:
Einband:
gebundenes Buch
Erschienen am 01.10.2009
Auflage: 1/2009
- Zusatztext
- InhaltsangabeMethod for Precise Force Measurements.- Force Spectroscopy on Semiconductor Surfaces.- Tip–Sample Interactions as a Function of Distance on Insulating Surfaces.- Force Field Spectroscopy in Three Dimensions.- Principles and Applications of the qPlus Sensor.- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond.- Atom Manipulation on Semiconductor Surfaces.- Atomic Manipulation on Metal Surfaces.- Atomic Manipulation on an Insulator Surface.- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM.- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces.- Magnetic Exchange Force Microscopy.- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001).- Frequency Modulation Atomic Force Microscopy in Liquids.- Biological Applications of FM-AFM in Liquid Environment.- High-Frequency Low Amplitude Atomic Force Microscopy.- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
- Kurztext
- InhaltsangabeIntroduction.- Method for Precise Force Measurements.- Force Spectroscopy on Semiconductors.- Tip-sample Interactions as a Function of Distance on Insulating Surfaces.- Imaging and Force Spectroscopy on Layered Materials.- Principles and Applications of the qPlus Sensor.- Atomic Resolution Imaging and Site-Specific Spectroscopy on Model Catalyst.- Atom Manipulation on Semiconductor Surfaces.- Atomic Manipulation on Metal Surfaces.- Atom Manipulation on Insulator Surfaces.- Simulations on Atomic Manipulation on Semiconductor Surfaces.- Multi-Scale Modeling of NC-AFM Imaging and Controlling Atomic Dynamics at Insulating Surfaces.- Magnetic Exchange Force Microscopy.- Frequency Modulation Atomic Force Microscopy in Liquids.- Biological Applications of FM-AFM for Liquid Environment.- Low Amplitude High-Frequency Imaging with Deflection and Torsion of the Cantilever in Vacuum and Liquid.- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.-